Plasmonic Reliability

Reliability of electro-optic components is at the heart of the effort towards commercialization and concerns all materials in plasmonic devices. In particular the organic materials employed must be protected from the environment. As for comparable functional materials such as organics in OLED displays, demonstration of a proper encapsulation is an engineering effort.

There is No Fundamental Limit to Plasmonic Reliability

Tests made by organic material producers have demonstrated that electro-optic materials employed are stable under inert atmosphere. As a consequence given the right encapsulation from the environment, the materials can be considered stable against aggressors like heat, oxygen, water and pressure. Coming soon.

High-Temperature Storage (HTS)

Storage long-term stability at 85°C provide an excellent way to verify ever improving encapsulation technology. Of course we measure a dozen of electrical and optical properties, then again the key stability metric for plasmonics is the potential change of V_π as a result of aging.

Find here the newest results of a normalized V_π for plasmonic MZMs stored at 85°C and measured repeatedly. The last measurement done after 1000 hours and a fit trend with exponential fit through the average of the measurement. The exponential decrease is in line with theoretical considerations.

HTS, 85°C, change of less than 5% in 1000 hours

High-Temperature Operating Life (HTOL)

Tests performed at 85°C and 105°C, biased and stressed with various optical input power. Coming soon.

Highly Accelerated Stress Test (HAST)

Adding wet pressure to the stress. Coming soon.

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