Electro-optical device characterization

    • Optical and electrical performance testing
    • Packaged dies or at wafer level
    • Insertion loss, cross-talk, frequency response, eye diagrams up to 200 Gbit/s
    • More testing on request
Electro-optical device characterization

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Polariton Technologies AG
c/o ETH Zürich
Postfach 9000
8803 Rüschlikon


We are revolutionizing our future communication network and contributing to the world through research, scientific accuracy and our very own set of values that we do not compromise.

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